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      1. Wireline test (LAN, DSL, cable)

        LAN/WAN test equipment design IC solutions from TI


        Wide bandwidth, high dynamic range frontend with low-noise clock is critical for analyzing the amplitude and timing of the LAN/WAN signals. Our integrated circuits and reference designs help you design high-performance data acquisition and arbitrary waveform generation frontend for LAN/WAN test equipment.

          High-performing LAN / WAN test equipment often requires:

        • High-speed data converters that help with timing and noise margin measurement
        • Low-phase noise clocks for improved timing margins and jitter measurements
        • Efficient power supply that minimizes board area and improves thermal performance
        • Low EMI power architecture that improves system sensitivity and dynamic range
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        Technical documents

        Application notes & user guides

        Application Notes (5)

        Title Type Size (KB) Date
        PDF 6.09 MB 08 Aug 2017
        PDF 2.56 MB 20 Jul 2017
        PDF 1.63 MB 21 Jul 2016
        PDF 70 KB 26 Apr 2013
        PDF 505 KB 25 Apr 2010

        User Guides (1)

        Title Type Size (KB) Date
        pdf 1.96 MB 20 Sep 2018

        Product bulletin & white papers

        White Papers (1)

        Title Type Size (MB) Date
        PDF 91 KB 01 May 2007

        Technical articles

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