Wide bandwidth, high dynamic range frontend with low-noise clock is critical for analyzing the amplitude and timing of the LAN/WAN signals. Our integrated circuits and reference designs help you design high-performance data acquisition and arbitrary waveform generation frontend for LAN/WAN test equipment.
High-performing LAN / WAN test equipment often requires:
|6.09 MB||08 Aug 2017|
|2.56 MB||20 Jul 2017|
|1.63 MB||21 Jul 2016|
|70 KB||26 Apr 2013|
|505 KB||25 Apr 2010|
|1.96 MB||20 Sep 2018|
|91 KB||01 May 2007|
Search our extensive online knowledge base where millions of technical questions and answers are available 24/7.Search answers from TI experts
Content is provided 'AS IS' by the respective TI and Community contributors and does not constitute TI specifications.
If you have questions about quality, packaging, or ordering TI products visit our Support page.